File:Fib tem sample.jpg
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Summary
SEM micrograph of a wide-bandgap semiconductor prepared for TEM by focused-ion-beam milling.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 23:59, 13 January 2017 | | 1,024 × 800 (205 KB) | 127.0.0.1 (talk) | SEM micrograph of a wide-bandgap semiconductor prepared for TEM by focused-ion-beam milling. |
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