X-Ray Spectrometry (journal)

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X-Ray Spectrometry  
File:XRS new cover.gif
Abbreviated title (ISO 4)
X Ray Spectrom.
Discipline X-ray spectrometry
Language English
Edited by R. Van Grieken
Publication details
Publisher
Publication history
1972-present
Frequency Bimonthly
1.445
Indexing
ISSN 0049-8246 (print)
1097-4539 (web)
LCCN 72627130
CODEN XRSPAX
OCLC no. 474795286
Links

X-Ray Spectrometry is a bimonthly peer-reviewed scientific journal established in 1972 and published by John Wiley & Sons. It covers the theory and application of X-ray spectrometry. The current editor-in-chief is R. Van Grieken (University of Antwerp).

Abstracting and indexing

The journal is abstracted and indexed in:

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According to the Journal Citation Reports, the journal has a 2011 impact factor of 1.445, ranking it 25th out of 42 journals in the category "Spectroscopy".[1]

Notable articles

The highest-cited articles from this journal are:

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References

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External links